VALIDATION AND TEST FOR NANOMETER SoCs
Embedded Systems Design, Automation, and Test
Dept. of ECE
,
UCSD
Principal Investigator:
Sujit Dey
Projects:
Self testing of embedded processor cores and system-on-chips
Testing for signal integrity in deep submicron SoCs
Publications List
Please direct any feedback to
Naomi Ramos
Last modified : August 2003