Mobile Systems Design and Test Lab Principal Investigator:
Professor Sujit Dey

University of California, San Diego

Overview Projects People Publications News Contact Us Links

Adaptive Wireless
and Protocols
Low Power
System Design
Reliable Nanometer
Wireless Sensor

Reliable Nanometer Technology SoCs:

In this research area, we investigate techniques to improve the reliability of nanometer circuits and systems. Our recent work has been in understanding transient-error and designing robust systems that are tolerant of these errors. Below is a list of researchers, current projects, and selected publications.


  Principal Investigator - Professor Sujit Dey
  Current Students - Chong Zhao

Related Projects:

  • Analysis and Design of Transient-Error-Tolerant Nanometer Circuits and Systems

Selected Publications:

  • Chong Zhao, Xiaoliang Bai, Sujit Dey, "Efficient transient error effects in digital nanometer circuits," to appear in IEEE Transactions on Reliability.

  • Chong Zhao, Yi Zhao, Sujit Dey, "An Intelligent Robustness Insertion Methodology for Optimal Transient Error Tolerance", to appear in IEEE transaction on Very Large Scale Integration Systems.

  • Chong Zhao, Sujit Dey, "Modeling Soft Error Effects Considering Process Variations," to appear in International Conference on Computer Design (ICCD), October 2007, Lake Tahoe, California.

  • Chong Zhao, Sujit Dey, "Evaluating and Improving Transient Error Tolerance of CMOS Digital VLSI Circuits," in Proceedings of the International Test Conference 2006 (ITC), pp.29.1, October 2006, Santa Clara, California.

  • Chong Zhao, Sujit Dey, "Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)", in Proceedings of 7th International Symposium on Quality Electronic Design (ISQED), pp. 133-138, March 2006, San Jose, California, USA. paper and talk. Best Paper Award
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