Testing for interconnect crosstalk defects using on-chip embedded processor cores,
L.Chen, X.Bai, S.Dey, "Testing for interconnect crosstalk defects using on-chip embedded processor cores," in Proc. Design Automation Conf., Las Vegas, June 2001.
L.Chen, X.Bai, S.Dey, "Testing for interconnect crosstalk defects using on-chip embedded processor cores," in Proc. Design Automation Conf., Las Vegas, June 2001.