A Static Noise Impact Analysis Methodology for Evaluating Transient Error Effects in Digital VLSI Circuits
Chong Zhao, Xiaoliang Bai, Sujit Dey, "A Static Noise Impact Analysis Methodology for Evaluating Transient Error Effects in Digital VLSI Circuits", in Proceedings of International Test Conference 2005, pp. 40.2, October, 2005, Austin, Texas, USA.