DEFUSE: A Deterministic Functional Self-Test Methodology for Processors,
L.Chen, S.Dey, "DEFUSE: A Deterministic Functional Self-Test Methodology for Processors," in Proc. VLSI Test Symposium, Montreal, April 2000.
L.Chen, S.Dey, "DEFUSE: A Deterministic Functional Self-Test Methodology for Processors," in Proc. VLSI Test Symposium, Montreal, April 2000.