Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)
Chong Zhao, Sujit Dey, "Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)", in Proceedings of 7th International Symposium on Quality Electronic Design (ISQED), pp. 133-138, March 2006, San Jose, California, USA. Best Paper Award