Past Students Xiaoliang Bai PhD '03 Publications A Scalable Soft Spot Analysis Methodology for Compount Noise Effects in Nano-meter Circuits A Static Noise Impact Analysis Methodology for Evaluating Transient Error Effects in Digital VLSI Circuits ATPG for Crosstalk using Hybrid Structural SAT, Efficient transient error effects in digital nanometer circuits Fault Modeling and Simulation for Crosstalk in System-on-Chip Interconnects High-level Crosstalk Defect Simulation for System-on-Chip Interconnects High-level Crosstalk Defect Simulation Methodology for System-on-Chip Interconnects, Interconnect Coupling-Aware Driver Modeling in Static Noise Analysis for Nanometer Circuits, Noise-Aware Driver Modeling Self-Test Methodology for At-Speed Test of Crosstalk in Chip Interconnects Soft Spot Analysis: A Scalable Methodology Targeting Compound Noise Effects in Nano-meter Circuits Software-Based Self-Test Methodology for Crosstalk Faults in Processors, Testing for interconnect crosstalk defects using on-chip embedded processor cores, Testing for interconnect crosstalk defects using on-chip embedded processor cores,
