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Mobile Systems Design Lab

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  • Principal Investigator
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    • Abhishek Agrawal
    • Hasti Ahlehagh
    • Xiaoliang Bai
    • Saumya Chandra
    • Li Chen
    • Ying-Hung Chen
    • Ranjini Guruprasad
    • Mrunal Kulkarni
    • Kanishka Lahiri
    • Dong-Gi Lee
    • Yao Liu
    • Yao Lu
    • Weiheng Ni
    • Ali Mirtar
    • Shoubhik Mukhopadhyay
    • Debashis Panigrahi
    • Naomi Ramos
    • Krishna Sekar
    • Clark N. Taylor
    • Pam Tsui
    • Chetan Verma
    • Shaoxuan Wang
    • Tyler White
    • Chong Zhao
    • Yi Zhao
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Chong Zhao

PhD '07

Publications

A Scalable Soft Spot Analysis Methodology for Compount Noise Effects in Nano-meter Circuits
A Static Noise Impact Analysis Methodology for Evaluating Transient Error Effects in Digital VLSI Circuits
An Intelligent Robustness Insertion Methodology for Optimal Transient Error Tolerance
Analysis of Interconnect Crosstalk Defect Coverage of Test
Constraint-Aware Robustness Insertion for Optimal Noise-Tolerance Enhancement in VLSI Circuits,
Efficient transient error effects in digital nanometer circuits
Evaluating and Improving Transient Error Tolerance of CMOS Digital VLSI Circuits
Fault Coverage Analysis Techniques of Crosstalk in Chip Interconnects,
Fault Modeling and Simulation for Crosstalk in System-on-Chip Interconnects
Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)
Modeling Soft Error Effects Considering Process Variations
On-line Testing for Multi-source Noise-induced Errors in System-on-Chip Interconnects and Buses,
On-line testing of multi-source noise-induced errors on the interconnects and buses of system-on-chips,
Separate Dual Transistor Registor-an Circuit Solution for on-line Testing of Transient Errors in UDSM-IC,
Soft Spot Analysis: A Scalable Methodology Targeting Compound Noise Effects in Nano-meter Circuits

 

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Franklin Antonio Hall
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9500 Gilman Drive
La Jolla, CA 92093-0433

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